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array(65) { ["id"]=> string(3) "921" ["pdf_add"]=> string(48) "http://www.ti.com/lit/ds/symlink/sn74abt8652.pdf" ["pdf_dir"]=> string(0) "" ["images_sw"]=> string(1) " " ["images_mk"]=> string(64) "//media.digikey.com/Renders/~~Pkg.Case%20or%20Series/28-SOIC.jpg" ["images"]=> string(80) "https://www.chenkeiot.com/Public/imagesmk/Renders/Pkg.Case_or_Series/28-SOIC.jpg" ["images_dir"]=> string(0) "" ["ljbh"]=> string(13) "296-4114-5-ND" ["zzsbh"]=> string(13) "SN74ABT8652DL" ["zddgs"]=> string(1) "1" ["xysl"]=> string(3) "131" ["cfkc"]=> string(1) "0" ["dj"]=> string(9) "46.484000" ["gys_id"]=> string(3) "249" ["num"]=> string(1) " " ["price_addtime"]=> string(1) "0" ["ms"]=> string(29) "IC SCAN-TEST-DEV/XCVR 28-SSOP" ["xl"]=> string(5) "74ABT" ["zzs"]=> string(15) "TI/德州仪器" ["zzs_new"]=> string(15) "TI/德州仪器" ["zzs_old"]=> string(17) "Texas Instruments" ["lm"]=> string(1) "-" ["tdxl"]=> string(9) "未设定" ["ljlx"]=> string(51) "扫描测试设备，带总线收发器和寄存器" ["dydy"]=> string(11) "4.5V ~ 5.5V" ["ws"]=> string(1) "8" ["gzwd"]=> string(14) "-40°C ~ 85°C" ["azlx"]=> string(15) "表面贴装型" ["fz_wk"]=> string(20) "28-BSSOP(7.50mm 宽)" ["gysqjfz"]=> string(8) "28-BSSOP" ["djs"]=> string(1) "-" ["tag"]=> string(1) " " ["bz"]=> string(6) "管件" ["spq"]=> string(2) "40" ["moq"]=> string(2) "10" ["is_rohs"]=> string(1) "1" ["gl_zz"]=> string(6) "贴片" ["gl_pin"]=> string(2) "28" ["gl_dm"]=> string(7) "ABT8652" ["gl_dmtp"]=> string(0) "" ["symbol"]=> string(0) "" ["gl_vdd"]=> string(1) "-" ["gl_gnd"]=> string(1) "-" ["gl_jz"]=> string(1) " " ["gl_bdm"]=> string(1) "4" ["gl_bdmsm"]=> string(0) "" ["gl_kbc"]=> string(1) "0" ["gl_dmgx"]=> string(1) "0" ["pcbfzk_id"]=> string(0) "" ["pcbfzk"]=> string(1) "-" ["ljzt"]=> string(6) "在售" ["jyid"]=> string(1) "-" ["cat_id"]=> string(2) "63" ["wl_num"]=> string(4) "1115" ["admin_id"]=> string(1) "0" ["mpn_bm"]=> string(13) "golon_lj_zylj" ["ch_bm"]=> string(18) "专用逻辑器件" ["lock_dm"]=> string(1) "1" ["is_use_cat_id"]=> string(1) "0" ["is_new_time"]=> string(1) "0" ["ms_c"]=> string(1) " " ["ytfw"]=> string(1) "-" ["hot_or_top"]=> string(1) "0" ["yqjtd_pintopin"]=> string(1) " " ["yqjtd_jianrong"]=> string(1) " " }
select a.wl_num,a.parent_id,GROUP_CONCAT(b.cat_name,' ',a.cat_name) as lb,a.action_name,a.rate,a.rate_hot,ROUND(sum(a.rate+a.rate_hot/100),4) as moq_rate from golon_ics_category a left join golon_ics_category b on a.parent_id=b.id where a.mpn_bm='golon_lj_zylj' array(1) { [0]=> array(7) { ["wl_num"]=> string(4) "1115" ["parent_id"]=> string(2) "62" ["lb"]=> string(26) "逻辑 专用逻辑器件" ["action_name"]=> string(2) "l1" ["rate"]=> string(5) "1.051" ["rate_hot"]=> string(2) "35" ["moq_rate"]=> string(6) "1.4010" } }
型号： SN74ABT8652DL复制
状态： 在售 修改
品牌： TI/德州仪器复制
封装：28-BSSOP
外壳：28-BSSOP(7.50mm 宽)
描述： IC SCAN-TEST-DEV/XCVR 28-SSOP
SELECT * FROM `golon_lj_zylj` WHERE ( `id` = 921 ) LIMIT 1
系列：74ABT
逻辑类型：扫描测试设备，带总线收发器和寄存器
电源电压(Vin)：4.5V ~ 5.5V
位数：8
工作温度：-40°C ~ 85°C
丝印：(请登录)
料号：1115921
10+: ￥65.12
1000+: ￥48.85 array(5) { ["count"]=> string(1) "1" ["gys_id"]=> string(3) "249" ["zzsbh"]=> string(13) "SN74ABT8652DL" ["price"]=> string(6) "46.484" ["show_price"]=> string(0) "" }
起订量:10 修改
包装量: 40个/ 管件 修改
个
总额：
SELECT count(a.gys_id) as c FROM golon_gys_file_new a LEFT JOIN golon_gys_brand b on a.gys_id=b.id WHERE ( a.zzsbh = 'SN74ABT8652DL' ) LIMIT 1
供应商:
array(65) { ["id"]=> string(3) "980" ["pdf_add"]=> string(48) "http://www.ti.com/lit/ds/symlink/sn74abt8543.pdf" ["pdf_dir"]=> string(0) "" ["images_sw"]=> string(1) " " ["images_mk"]=> string(64) "//media.digikey.com/Renders/~~Pkg.Case%20or%20Series/28-SOIC.jpg" ["images"]=> string(80) "https://www.chenkeiot.com/Public/imagesmk/Renders/Pkg.Case_or_Series/28-SOIC.jpg" ["images_dir"]=> string(0) "" ["ljbh"]=> string(13) "296-4107-5-ND" ["zzsbh"]=> string(13) "SN74ABT8543DL" ["zddgs"]=> string(1) "1" ["xysl"]=> string(3) "100" ["cfkc"]=> string(1) "0" ["dj"]=> string(9) "46.762000" ["gys_id"]=> string(3) "249" ["num"]=> string(1) " " ["price_addtime"]=> string(1) "0" ["ms"]=> string(29) "IC SCAN TEST DEV/TXRX 28-SSOP" ["xl"]=> string(5) "74ABT" ["zzs"]=> string(15) "TI/德州仪器" ["zzs_new"]=> string(15) "TI/德州仪器" ["zzs_old"]=> string(17) "Texas Instruments" ["lm"]=> string(1) "-" ["tdxl"]=> string(9) "未设定" ["ljlx"]=> string(45) "扫描测试设备，带寄存总线收发器" ["dydy"]=> string(11) "4.5V ~ 5.5V" ["ws"]=> string(1) "8" ["gzwd"]=> string(14) "-40°C ~ 85°C" ["azlx"]=> string(15) "表面贴装型" ["fz_wk"]=> string(20) "28-BSSOP(7.50mm 宽)" ["gysqjfz"]=> string(8) "28-BSSOP" ["djs"]=> string(1) "-" ["tag"]=> string(1) " " ["bz"]=> string(6) "管件" ["spq"]=> string(2) "40" ["moq"]=> string(2) "10" ["is_rohs"]=> string(1) "1" ["gl_zz"]=> string(6) "贴片" ["gl_pin"]=> string(2) "28" ["gl_dm"]=> string(7) "ABT8543" ["gl_dmtp"]=> string(0) "" ["symbol"]=> string(0) "" ["gl_vdd"]=> string(1) "-" ["gl_gnd"]=> string(1) "-" ["gl_jz"]=> string(1) " " ["gl_bdm"]=> string(1) "4" ["gl_bdmsm"]=> string(0) "" ["gl_kbc"]=> string(1) "0" ["gl_dmgx"]=> string(1) "0" ["pcbfzk_id"]=> string(0) "" ["pcbfzk"]=> string(1) "-" ["ljzt"]=> string(6) "在售" ["jyid"]=> string(1) "-" ["cat_id"]=> string(2) "63" ["wl_num"]=> string(4) "1115" ["admin_id"]=> string(1) "0" ["mpn_bm"]=> string(13) "golon_lj_zylj" ["ch_bm"]=> string(18) "专用逻辑器件" ["lock_dm"]=> string(1) "1" ["is_use_cat_id"]=> string(1) "0" ["is_new_time"]=> string(1) "0" ["ms_c"]=> string(1) " " ["ytfw"]=> string(1) "-" ["hot_or_top"]=> string(1) "0" ["yqjtd_pintopin"]=> string(1) " " ["yqjtd_jianrong"]=> string(1) " " }
select a.wl_num,a.parent_id,GROUP_CONCAT(b.cat_name,' ',a.cat_name) as lb,a.action_name,a.rate,a.rate_hot,ROUND(sum(a.rate+a.rate_hot/100),4) as moq_rate from golon_ics_category a left join golon_ics_category b on a.parent_id=b.id where a.mpn_bm='golon_lj_zylj' array(1) { [0]=> array(7) { ["wl_num"]=> string(4) "1115" ["parent_id"]=> string(2) "62" ["lb"]=> string(26) "逻辑 专用逻辑器件" ["action_name"]=> string(2) "l1" ["rate"]=> string(5) "1.051" ["rate_hot"]=> string(2) "35" ["moq_rate"]=> string(6) "1.4010" } }
型号： SN74ABT8543DL复制
状态： 在售 修改
品牌： TI/德州仪器复制
封装：28-BSSOP
外壳：28-BSSOP(7.50mm 宽)
描述： IC SCAN TEST DEV/TXRX 28-SSOP
SELECT * FROM `golon_lj_zylj` WHERE ( `id` = 980 ) LIMIT 1
系列：74ABT
逻辑类型：扫描测试设备，带寄存总线收发器
电源电压(Vin)：4.5V ~ 5.5V
位数：8
工作温度：-40°C ~ 85°C
丝印：(请登录)
料号：1115980
10+: ￥65.51
1000+: ￥49.15 array(5) { ["count"]=> string(1) "1" ["gys_id"]=> string(3) "249" ["zzsbh"]=> string(13) "SN74ABT8543DL" ["price"]=> string(6) "46.762" ["show_price"]=> string(0) "" }
起订量:10 修改
包装量: 40个/ 管件 修改
个
总额：
SELECT count(a.gys_id) as c FROM golon_gys_file_new a LEFT JOIN golon_gys_brand b on a.gys_id=b.id WHERE ( a.zzsbh = 'SN74ABT8543DL' ) LIMIT 1
供应商:
array(65) { ["id"]=> string(2) "37" ["pdf_add"]=> string(97) "http://media.digikey.com/pdf/Data%20Sheets/Texas%20Instruments%20PDFs/SN54ABT8952_SN74ABT8952.pdf" ["pdf_dir"]=> string(0) "" ["images_sw"]=> string(1) " " ["images_mk"]=> string(64) "//media.digikey.com/Renders/~~Pkg.Case%20or%20Series/28-SOIC.jpg" ["images"]=> string(80) "https://www.chenkeiot.com/Public/imagesmk/Renders/Pkg.Case_or_Series/28-SOIC.jpg" ["images_dir"]=> string(0) "" ["ljbh"]=> string(13) "296-4115-5-ND" ["zzsbh"]=> string(13) "SN74ABT8952DL" ["zddgs"]=> string(1) "1" ["xysl"]=> string(1) "0" ["cfkc"]=> string(1) "0" ["dj"]=> string(8) "0.000000" ["gys_id"]=> string(1) " " ["num"]=> string(1) " " ["price_addtime"]=> string(1) "0" ["ms"]=> string(29) "IC SCAN-TEST-DEV/XCVR 28-SSOP" ["xl"]=> string(5) "74ABT" ["zzs"]=> string(15) "TI/德州仪器" ["zzs_new"]=> string(15) "TI/德州仪器" ["zzs_old"]=> string(17) "Texas Instruments" ["lm"]=> string(1) "-" ["tdxl"]=> string(9) "未设定" ["ljlx"]=> string(45) "扫描测试设备，带寄存总线收发器" ["dydy"]=> string(11) "4.5V ~ 5.5V" ["ws"]=> string(1) "8" ["gzwd"]=> string(14) "-40°C ~ 85°C" ["azlx"]=> string(15) "表面贴装型" ["fz_wk"]=> string(20) "28-BSSOP(7.50mm 宽)" ["gysqjfz"]=> string(8) "28-BSSOP" ["djs"]=> string(1) "-" ["tag"]=> string(1) " " ["bz"]=> string(6) "管件" ["spq"]=> string(2) "40" ["moq"]=> string(2) "10" ["is_rohs"]=> string(1) "1" ["gl_zz"]=> string(6) "贴片" ["gl_pin"]=> string(2) "28" ["gl_dm"]=> string(1) "-" ["gl_dmtp"]=> string(0) "" ["symbol"]=> string(0) "" ["gl_vdd"]=> string(1) "-" ["gl_gnd"]=> string(1) "-" ["gl_jz"]=> string(1) " " ["gl_bdm"]=> string(1) "4" ["gl_bdmsm"]=> string(0) "" ["gl_kbc"]=> string(1) "0" ["gl_dmgx"]=> string(1) "0" ["pcbfzk_id"]=> string(0) "" ["pcbfzk"]=> string(1) "-" ["ljzt"]=> string(6) "停产" ["jyid"]=> string(1) "-" ["cat_id"]=> string(2) "63" ["wl_num"]=> string(4) "1115" ["admin_id"]=> string(1) "0" ["mpn_bm"]=> string(13) "golon_lj_zylj" ["ch_bm"]=> string(18) "专用逻辑器件" ["lock_dm"]=> string(1) "1" ["is_use_cat_id"]=> string(1) "0" ["is_new_time"]=> string(1) "0" ["ms_c"]=> string(1) " " ["ytfw"]=> string(1) "-" ["hot_or_top"]=> string(1) "0" ["yqjtd_pintopin"]=> string(1) " " ["yqjtd_jianrong"]=> string(1) " " }
select a.wl_num,a.parent_id,GROUP_CONCAT(b.cat_name,' ',a.cat_name) as lb,a.action_name,a.rate,a.rate_hot,ROUND(sum(a.rate+a.rate_hot/100),4) as moq_rate from golon_ics_category a left join golon_ics_category b on a.parent_id=b.id where a.mpn_bm='golon_lj_zylj' array(1) { [0]=> array(7) { ["wl_num"]=> string(4) "1115" ["parent_id"]=> string(2) "62" ["lb"]=> string(26) "逻辑 专用逻辑器件" ["action_name"]=> string(2) "l1" ["rate"]=> string(5) "1.051" ["rate_hot"]=> string(2) "35" ["moq_rate"]=> string(6) "1.4010" } }
型号： SN74ABT8952DL复制
状态： 停产 修改
品牌： TI/德州仪器复制
封装：28-BSSOP
外壳：28-BSSOP(7.50mm 宽)
描述： IC SCAN-TEST-DEV/XCVR 28-SSOP
SELECT * FROM `golon_lj_zylj` WHERE ( `id` = 37 ) LIMIT 1
系列：74ABT
逻辑类型：扫描测试设备，带寄存总线收发器
电源电压(Vin)：4.5V ~ 5.5V
位数：8
工作温度：-40°C ~ 85°C
丝印：(请登录)
料号：111537
量大可议价
起订量:10 修改
包装量: 40个/ 管件 修改
个
总额：
SELECT count(a.gys_id) as c FROM golon_gys_file_new a LEFT JOIN golon_gys_brand b on a.gys_id=b.id WHERE ( a.zzsbh = 'SN74ABT8952DL' ) LIMIT 1
array(65) { ["id"]=> string(2) "69" ["pdf_add"]=> string(48) "http://www.ti.com/lit/ds/symlink/sn74abt8652.pdf" ["pdf_dir"]=> string(0) "" ["images_sw"]=> string(1) " " ["images_mk"]=> string(64) "//media.digikey.com/Renders/~~Pkg.Case%20or%20Series/28-SOIC.jpg" ["images"]=> string(80) "https://www.chenkeiot.com/Public/imagesmk/Renders/Pkg.Case_or_Series/28-SOIC.jpg" ["images_dir"]=> string(0) "" ["ljbh"]=> string(17) "SN74ABT8652DLR-ND" ["zzsbh"]=> string(14) "SN74ABT8652DLR" ["zddgs"]=> string(4) "1000" ["xysl"]=> string(1) "0" ["cfkc"]=> string(1) "0" ["dj"]=> string(8) "0.000000" ["gys_id"]=> string(1) " " ["num"]=> string(1) " " ["price_addtime"]=> string(1) "0" ["ms"]=> string(27) "IC SCAN TEST DEVICE 28-SSOP" ["xl"]=> string(5) "74ABT" ["zzs"]=> string(15) "TI/德州仪器" ["zzs_new"]=> string(15) "TI/德州仪器" ["zzs_old"]=> string(17) "Texas Instruments" ["lm"]=> string(1) "-" ["tdxl"]=> string(9) "未设定" ["ljlx"]=> string(51) "扫描测试设备，带总线收发器和寄存器" ["dydy"]=> string(11) "4.5V ~ 5.5V" ["ws"]=> string(1) "8" ["gzwd"]=> string(14) "-40°C ~ 85°C" ["azlx"]=> string(15) "表面贴装型" ["fz_wk"]=> string(20) "28-BSSOP(7.50mm 宽)" ["gysqjfz"]=> string(8) "28-BSSOP" ["djs"]=> string(1) "-" ["tag"]=> string(1) " " ["bz"]=> string(14) "卷带（TR）" ["spq"]=> string(4) "1000" ["moq"]=> string(2) "10" ["is_rohs"]=> string(1) "1" ["gl_zz"]=> string(6) "贴片" ["gl_pin"]=> string(2) "28" ["gl_dm"]=> string(7) "ABT8652" ["gl_dmtp"]=> string(0) "" ["symbol"]=> string(0) "" ["gl_vdd"]=> string(1) "-" ["gl_gnd"]=> string(1) "-" ["gl_jz"]=> string(1) " " ["gl_bdm"]=> string(1) "4" ["gl_bdmsm"]=> string(0) "" ["gl_kbc"]=> string(1) "0" ["gl_dmgx"]=> string(1) "0" ["pcbfzk_id"]=> string(0) "" ["pcbfzk"]=> string(1) "-" ["ljzt"]=> string(6) "停产" ["jyid"]=> string(1) "-" ["cat_id"]=> string(2) "63" ["wl_num"]=> string(4) "1115" ["admin_id"]=> string(1) "0" ["mpn_bm"]=> string(13) "golon_lj_zylj" ["ch_bm"]=> string(18) "专用逻辑器件" ["lock_dm"]=> string(1) "1" ["is_use_cat_id"]=> string(1) "0" ["is_new_time"]=> string(1) "0" ["ms_c"]=> string(1) " " ["ytfw"]=> string(1) "-" ["hot_or_top"]=> string(1) "0" ["yqjtd_pintopin"]=> string(1) " " ["yqjtd_jianrong"]=> string(1) " " }
select a.wl_num,a.parent_id,GROUP_CONCAT(b.cat_name,' ',a.cat_name) as lb,a.action_name,a.rate,a.rate_hot,ROUND(sum(a.rate+a.rate_hot/100),4) as moq_rate from golon_ics_category a left join golon_ics_category b on a.parent_id=b.id where a.mpn_bm='golon_lj_zylj' array(1) { [0]=> array(7) { ["wl_num"]=> string(4) "1115" ["parent_id"]=> string(2) "62" ["lb"]=> string(26) "逻辑 专用逻辑器件" ["action_name"]=> string(2) "l1" ["rate"]=> string(5) "1.051" ["rate_hot"]=> string(2) "35" ["moq_rate"]=> string(6) "1.4010" } }
型号： SN74ABT8652DLR复制
状态： 停产 修改
品牌： TI/德州仪器复制
封装：28-BSSOP
外壳：28-BSSOP(7.50mm 宽)
描述： IC SCAN TEST DEVICE 28-SSOP
SELECT * FROM `golon_lj_zylj` WHERE ( `id` = 69 ) LIMIT 1
系列：74ABT
逻辑类型：扫描测试设备，带总线收发器和寄存器
电源电压(Vin)：4.5V ~ 5.5V
位数：8
工作温度：-40°C ~ 85°C
丝印：(请登录)
料号：111569
量大可议价
起订量:10 修改
包装量: 1000个/ 卷带（TR） 修改
个
总额：
SELECT count(a.gys_id) as c FROM golon_gys_file_new a LEFT JOIN golon_gys_brand b on a.gys_id=b.id WHERE ( a.zzsbh = 'SN74ABT8652DLR' ) LIMIT 1
array(65) { ["id"]=> string(2) "70" ["pdf_add"]=> string(48) "http://www.ti.com/lit/ds/symlink/sn74abt8652.pdf" ["pdf_dir"]=> string(0) "" ["images_sw"]=> string(1) " " ["images_mk"]=> string(64) "//media.digikey.com/Renders/~~Pkg.Case%20or%20Series/28-SOIC.jpg" ["images"]=> string(80) "https://www.chenkeiot.com/Public/imagesmk/Renders/Pkg.Case_or_Series/28-SOIC.jpg" ["images_dir"]=> string(0) "" ["ljbh"]=> string(19) "SN74ABT8652DLRG4-ND" ["zzsbh"]=> string(16) "SN74ABT8652DLRG4" ["zddgs"]=> string(4) "1000" ["xysl"]=> string(1) "0" ["cfkc"]=> string(1) "0" ["dj"]=> string(8) "0.000000" ["gys_id"]=> string(1) " " ["num"]=> string(1) " " ["price_addtime"]=> string(1) "0" ["ms"]=> string(27) "IC SCAN TEST DEVICE 28-SSOP" ["xl"]=> string(5) "74ABT" ["zzs"]=> string(15) "TI/德州仪器" ["zzs_new"]=> string(15) "TI/德州仪器" ["zzs_old"]=> string(17) "Texas Instruments" ["lm"]=> string(1) "-" ["tdxl"]=> string(9) "未设定" ["ljlx"]=> string(51) "扫描测试设备，带总线收发器和寄存器" ["dydy"]=> string(11) "4.5V ~ 5.5V" ["ws"]=> string(1) "8" ["gzwd"]=> string(14) "-40°C ~ 85°C" ["azlx"]=> string(15) "表面贴装型" ["fz_wk"]=> string(20) "28-BSSOP(7.50mm 宽)" ["gysqjfz"]=> string(8) "28-BSSOP" ["djs"]=> string(1) "-" ["tag"]=> string(1) " " ["bz"]=> string(14) "卷带（TR）" ["spq"]=> string(4) "1000" ["moq"]=> string(2) "10" ["is_rohs"]=> string(1) "1" ["gl_zz"]=> string(6) "贴片" ["gl_pin"]=> string(2) "28" ["gl_dm"]=> string(7) "ABT8652" ["gl_dmtp"]=> string(0) "" ["symbol"]=> string(0) "" ["gl_vdd"]=> string(1) "-" ["gl_gnd"]=> string(1) "-" ["gl_jz"]=> string(1) " " ["gl_bdm"]=> string(1) "4" ["gl_bdmsm"]=> string(0) "" ["gl_kbc"]=> string(1) "0" ["gl_dmgx"]=> string(1) "0" ["pcbfzk_id"]=> string(0) "" ["pcbfzk"]=> string(1) "-" ["ljzt"]=> string(6) "停产" ["jyid"]=> string(1) "-" ["cat_id"]=> string(2) "63" ["wl_num"]=> string(4) "1115" ["admin_id"]=> string(1) "0" ["mpn_bm"]=> string(13) "golon_lj_zylj" ["ch_bm"]=> string(18) "专用逻辑器件" ["lock_dm"]=> string(1) "1" ["is_use_cat_id"]=> string(1) "0" ["is_new_time"]=> string(1) "0" ["ms_c"]=> string(1) " " ["ytfw"]=> string(1) "-" ["hot_or_top"]=> string(1) "0" ["yqjtd_pintopin"]=> string(1) " " ["yqjtd_jianrong"]=> string(1) " " }
select a.wl_num,a.parent_id,GROUP_CONCAT(b.cat_name,' ',a.cat_name) as lb,a.action_name,a.rate,a.rate_hot,ROUND(sum(a.rate+a.rate_hot/100),4) as moq_rate from golon_ics_category a left join golon_ics_category b on a.parent_id=b.id where a.mpn_bm='golon_lj_zylj' array(1) { [0]=> array(7) { ["wl_num"]=> string(4) "1115" ["parent_id"]=> string(2) "62" ["lb"]=> string(26) "逻辑 专用逻辑器件" ["action_name"]=> string(2) "l1" ["rate"]=> string(5) "1.051" ["rate_hot"]=> string(2) "35" ["moq_rate"]=> string(6) "1.4010" } }
型号： SN74ABT8652DLRG4复制
状态： 停产 修改
品牌： TI/德州仪器复制
封装：28-BSSOP
外壳：28-BSSOP(7.50mm 宽)
描述： IC SCAN TEST DEVICE 28-SSOP
SELECT * FROM `golon_lj_zylj` WHERE ( `id` = 70 ) LIMIT 1
系列：74ABT
逻辑类型：扫描测试设备，带总线收发器和寄存器
电源电压(Vin)：4.5V ~ 5.5V
位数：8
工作温度：-40°C ~ 85°C
丝印：(请登录)
料号：111570
量大可议价
起订量:10 修改
包装量: 1000个/ 卷带（TR） 修改
个
总额：
SELECT count(a.gys_id) as c FROM golon_gys_file_new a LEFT JOIN golon_gys_brand b on a.gys_id=b.id WHERE ( a.zzsbh = 'SN74ABT8652DLRG4' ) LIMIT 1
array(65) { ["id"]=> string(2) "73" ["pdf_add"]=> string(97) "http://media.digikey.com/pdf/Data%20Sheets/Texas%20Instruments%20PDFs/SN54ABT8952_SN74ABT8952.pdf" ["pdf_dir"]=> string(0) "" ["images_sw"]=> string(1) " " ["images_mk"]=> string(64) "//media.digikey.com/Renders/~~Pkg.Case%20or%20Series/28-SOIC.jpg" ["images"]=> string(80) "https://www.chenkeiot.com/Public/imagesmk/Renders/Pkg.Case_or_Series/28-SOIC.jpg" ["images_dir"]=> string(0) "" ["ljbh"]=> string(17) "SN74ABT8952DLR-ND" ["zzsbh"]=> string(14) "SN74ABT8952DLR" ["zddgs"]=> string(4) "1000" ["xysl"]=> string(1) "0" ["cfkc"]=> string(1) "0" ["dj"]=> string(8) "0.000000" ["gys_id"]=> string(1) " " ["num"]=> string(1) " " ["price_addtime"]=> string(1) "0" ["ms"]=> string(28) "IC SCAN TESST DEVICE 28-SSOP" ["xl"]=> string(5) "74ABT" ["zzs"]=> string(15) "TI/德州仪器" ["zzs_new"]=> string(15) "TI/德州仪器" ["zzs_old"]=> string(17) "Texas Instruments" ["lm"]=> string(1) "-" ["tdxl"]=> string(9) "未设定" ["ljlx"]=> string(45) "扫描测试设备，带寄存总线收发器" ["dydy"]=> string(11) "4.5V ~ 5.5V" ["ws"]=> string(1) "8" ["gzwd"]=> string(14) "-40°C ~ 85°C" ["azlx"]=> string(15) "表面贴装型" ["fz_wk"]=> string(20) "28-BSSOP(7.50mm 宽)" ["gysqjfz"]=> string(8) "28-BSSOP" ["djs"]=> string(1) "-" ["tag"]=> string(1) " " ["bz"]=> string(14) "卷带（TR）" ["spq"]=> string(4) "1000" ["moq"]=> string(2) "10" ["is_rohs"]=> string(1) "1" ["gl_zz"]=> string(6) "贴片" ["gl_pin"]=> string(2) "28" ["gl_dm"]=> string(1) "-" ["gl_dmtp"]=> string(0) "" ["symbol"]=> string(0) "" ["gl_vdd"]=> string(1) "-" ["gl_gnd"]=> string(1) "-" ["gl_jz"]=> string(1) " " ["gl_bdm"]=> string(1) "4" ["gl_bdmsm"]=> string(0) "" ["gl_kbc"]=> string(1) "0" ["gl_dmgx"]=> string(1) "0" ["pcbfzk_id"]=> string(0) "" ["pcbfzk"]=> string(1) "-" ["ljzt"]=> string(6) "停产" ["jyid"]=> string(1) "-" ["cat_id"]=> string(2) "63" ["wl_num"]=> string(4) "1115" ["admin_id"]=> string(1) "0" ["mpn_bm"]=> string(13) "golon_lj_zylj" ["ch_bm"]=> string(18) "专用逻辑器件" ["lock_dm"]=> string(1) "1" ["is_use_cat_id"]=> string(1) "0" ["is_new_time"]=> string(1) "0" ["ms_c"]=> string(1) " " ["ytfw"]=> string(1) "-" ["hot_or_top"]=> string(1) "0" ["yqjtd_pintopin"]=> string(1) " " ["yqjtd_jianrong"]=> string(1) " " }
select a.wl_num,a.parent_id,GROUP_CONCAT(b.cat_name,' ',a.cat_name) as lb,a.action_name,a.rate,a.rate_hot,ROUND(sum(a.rate+a.rate_hot/100),4) as moq_rate from golon_ics_category a left join golon_ics_category b on a.parent_id=b.id where a.mpn_bm='golon_lj_zylj' array(1) { [0]=> array(7) { ["wl_num"]=> string(4) "1115" ["parent_id"]=> string(2) "62" ["lb"]=> string(26) "逻辑 专用逻辑器件" ["action_name"]=> string(2) "l1" ["rate"]=> string(5) "1.051" ["rate_hot"]=> string(2) "35" ["moq_rate"]=> string(6) "1.4010" } }
型号： SN74ABT8952DLR复制
状态： 停产 修改
品牌： TI/德州仪器复制
封装：28-BSSOP
外壳：28-BSSOP(7.50mm 宽)
描述： IC SCAN TESST DEVICE 28-SSOP
SELECT * FROM `golon_lj_zylj` WHERE ( `id` = 73 ) LIMIT 1
系列：74ABT
逻辑类型：扫描测试设备，带寄存总线收发器
电源电压(Vin)：4.5V ~ 5.5V
位数：8
工作温度：-40°C ~ 85°C
丝印：(请登录)
料号：111573
量大可议价
起订量:10 修改
包装量: 1000个/ 卷带（TR） 修改
个
总额：
SELECT count(a.gys_id) as c FROM golon_gys_file_new a LEFT JOIN golon_gys_brand b on a.gys_id=b.id WHERE ( a.zzsbh = 'SN74ABT8952DLR' ) LIMIT 1
array(65) { ["id"]=> string(2) "74" ["pdf_add"]=> string(97) "http://media.digikey.com/pdf/Data%20Sheets/Texas%20Instruments%20PDFs/SN54ABT8952_SN74ABT8952.pdf" ["pdf_dir"]=> string(0) "" ["images_sw"]=> string(1) " " ["images_mk"]=> string(64) "//media.digikey.com/Renders/~~Pkg.Case%20or%20Series/28-SOIC.jpg" ["images"]=> string(80) "https://www.chenkeiot.com/Public/imagesmk/Renders/Pkg.Case_or_Series/28-SOIC.jpg" ["images_dir"]=> string(0) "" ["ljbh"]=> string(19) "SN74ABT8952DLRG4-ND" ["zzsbh"]=> string(16) "SN74ABT8952DLRG4" ["zddgs"]=> string(4) "1000" ["xysl"]=> string(1) "0" ["cfkc"]=> string(1) "0" ["dj"]=> string(8) "0.000000" ["gys_id"]=> string(1) " " ["num"]=> string(1) " " ["price_addtime"]=> string(1) "0" ["ms"]=> string(28) "IC SCAN TESST DEVICE 28-SSOP" ["xl"]=> string(5) "74ABT" ["zzs"]=> string(15) "TI/德州仪器" ["zzs_new"]=> string(15) "TI/德州仪器" ["zzs_old"]=> string(17) "Texas Instruments" ["lm"]=> string(1) "-" ["tdxl"]=> string(9) "未设定" ["ljlx"]=> string(45) "扫描测试设备，带寄存总线收发器" ["dydy"]=> string(11) "4.5V ~ 5.5V" ["ws"]=> string(1) "8" ["gzwd"]=> string(14) "-40°C ~ 85°C" ["azlx"]=> string(15) "表面贴装型" ["fz_wk"]=> string(20) "28-BSSOP(7.50mm 宽)" ["gysqjfz"]=> string(8) "28-BSSOP" ["djs"]=> string(1) "-" ["tag"]=> string(1) " " ["bz"]=> string(14) "卷带（TR）" ["spq"]=> string(4) "1000" ["moq"]=> string(2) "10" ["is_rohs"]=> string(1) "1" ["gl_zz"]=> string(6) "贴片" ["gl_pin"]=> string(2) "28" ["gl_dm"]=> string(1) "-" ["gl_dmtp"]=> string(0) "" ["symbol"]=> string(0) "" ["gl_vdd"]=> string(1) "-" ["gl_gnd"]=> string(1) "-" ["gl_jz"]=> string(1) " " ["gl_bdm"]=> string(1) "4" ["gl_bdmsm"]=> string(0) "" ["gl_kbc"]=> string(1) "0" ["gl_dmgx"]=> string(1) "0" ["pcbfzk_id"]=> string(0) "" ["pcbfzk"]=> string(1) "-" ["ljzt"]=> string(6) "停产" ["jyid"]=> string(1) "-" ["cat_id"]=> string(2) "63" ["wl_num"]=> string(4) "1115" ["admin_id"]=> string(1) "0" ["mpn_bm"]=> string(13) "golon_lj_zylj" ["ch_bm"]=> string(18) "专用逻辑器件" ["lock_dm"]=> string(1) "1" ["is_use_cat_id"]=> string(1) "0" ["is_new_time"]=> string(1) "0" ["ms_c"]=> string(1) " " ["ytfw"]=> string(1) "-" ["hot_or_top"]=> string(1) "0" ["yqjtd_pintopin"]=> string(1) " " ["yqjtd_jianrong"]=> string(1) " " }
select a.wl_num,a.parent_id,GROUP_CONCAT(b.cat_name,' ',a.cat_name) as lb,a.action_name,a.rate,a.rate_hot,ROUND(sum(a.rate+a.rate_hot/100),4) as moq_rate from golon_ics_category a left join golon_ics_category b on a.parent_id=b.id where a.mpn_bm='golon_lj_zylj' array(1) { [0]=> array(7) { ["wl_num"]=> string(4) "1115" ["parent_id"]=> string(2) "62" ["lb"]=> string(26) "逻辑 专用逻辑器件" ["action_name"]=> string(2) "l1" ["rate"]=> string(5) "1.051" ["rate_hot"]=> string(2) "35" ["moq_rate"]=> string(6) "1.4010" } }
型号： SN74ABT8952DLRG4复制
状态： 停产 修改
品牌： TI/德州仪器复制
封装：28-BSSOP
外壳：28-BSSOP(7.50mm 宽)
描述： IC SCAN TESST DEVICE 28-SSOP
SELECT * FROM `golon_lj_zylj` WHERE ( `id` = 74 ) LIMIT 1
系列：74ABT
逻辑类型：扫描测试设备，带寄存总线收发器
电源电压(Vin)：4.5V ~ 5.5V
位数：8
工作温度：-40°C ~ 85°C
丝印：(请登录)
料号：111574
量大可议价
起订量:10 修改
包装量: 1000个/ 卷带（TR） 修改
个
总额：
SELECT count(a.gys_id) as c FROM golon_gys_file_new a LEFT JOIN golon_gys_brand b on a.gys_id=b.id WHERE ( a.zzsbh = 'SN74ABT8952DLRG4' ) LIMIT 1
array(65) { ["id"]=> string(3) "114" ["pdf_add"]=> string(48) "http://www.ti.com/lit/ds/symlink/sn74abt8543.pdf" ["pdf_dir"]=> string(0) "" ["images_sw"]=> string(1) " " ["images_mk"]=> string(64) "//media.digikey.com/Renders/~~Pkg.Case%20or%20Series/28-SOIC.jpg" ["images"]=> string(80) "https://www.chenkeiot.com/Public/imagesmk/Renders/Pkg.Case_or_Series/28-SOIC.jpg" ["images_dir"]=> string(0) "" ["ljbh"]=> string(17) "SN74ABT8543DLR-ND" ["zzsbh"]=> string(14) "SN74ABT8543DLR" ["zddgs"]=> string(4) "1000" ["xysl"]=> string(1) "0" ["cfkc"]=> string(1) "0" ["dj"]=> string(8) "0.000000" ["gys_id"]=> string(1) " " ["num"]=> string(1) " " ["price_addtime"]=> string(1) "0" ["ms"]=> string(27) "IC SCAN TEST DEVICE 28-SSOP" ["xl"]=> string(5) "74ABT" ["zzs"]=> string(15) "TI/德州仪器" ["zzs_new"]=> string(15) "TI/德州仪器" ["zzs_old"]=> string(17) "Texas Instruments" ["lm"]=> string(1) "-" ["tdxl"]=> string(9) "未设定" ["ljlx"]=> string(45) "扫描测试设备，带寄存总线收发器" ["dydy"]=> string(11) "4.5V ~ 5.5V" ["ws"]=> string(1) "8" ["gzwd"]=> string(14) "-40°C ~ 85°C" ["azlx"]=> string(15) "表面贴装型" ["fz_wk"]=> string(20) "28-BSSOP(7.50mm 宽)" ["gysqjfz"]=> string(8) "28-BSSOP" ["djs"]=> string(1) "-" ["tag"]=> string(1) " " ["bz"]=> string(14) "卷带（TR）" ["spq"]=> string(4) "1000" ["moq"]=> string(2) "10" ["is_rohs"]=> string(1) "1" ["gl_zz"]=> string(6) "贴片" ["gl_pin"]=> string(2) "28" ["gl_dm"]=> string(1) "-" ["gl_dmtp"]=> string(0) "" ["symbol"]=> string(0) "" ["gl_vdd"]=> string(1) "-" ["gl_gnd"]=> string(1) "-" ["gl_jz"]=> string(1) " " ["gl_bdm"]=> string(1) "4" ["gl_bdmsm"]=> string(0) "" ["gl_kbc"]=> string(1) "0" ["gl_dmgx"]=> string(1) "0" ["pcbfzk_id"]=> string(0) "" ["pcbfzk"]=> string(1) "-" ["ljzt"]=> string(6) "停产" ["jyid"]=> string(1) "-" ["cat_id"]=> string(2) "63" ["wl_num"]=> string(4) "1115" ["admin_id"]=> string(1) "0" ["mpn_bm"]=> string(13) "golon_lj_zylj" ["ch_bm"]=> string(18) "专用逻辑器件" ["lock_dm"]=> string(1) "1" ["is_use_cat_id"]=> string(1) "0" ["is_new_time"]=> string(1) "0" ["ms_c"]=> string(1) " " ["ytfw"]=> string(1) "-" ["hot_or_top"]=> string(1) "0" ["yqjtd_pintopin"]=> string(1) " " ["yqjtd_jianrong"]=> string(1) " " }
select a.wl_num,a.parent_id,GROUP_CONCAT(b.cat_name,' ',a.cat_name) as lb,a.action_name,a.rate,a.rate_hot,ROUND(sum(a.rate+a.rate_hot/100),4) as moq_rate from golon_ics_category a left join golon_ics_category b on a.parent_id=b.id where a.mpn_bm='golon_lj_zylj' array(1) { [0]=> array(7) { ["wl_num"]=> string(4) "1115" ["parent_id"]=> string(2) "62" ["lb"]=> string(26) "逻辑 专用逻辑器件" ["action_name"]=> string(2) "l1" ["rate"]=> string(5) "1.051" ["rate_hot"]=> string(2) "35" ["moq_rate"]=> string(6) "1.4010" } }
型号： SN74ABT8543DLR复制
状态： 停产 修改
品牌： TI/德州仪器复制
封装：28-BSSOP
外壳：28-BSSOP(7.50mm 宽)
描述： IC SCAN TEST DEVICE 28-SSOP
SELECT * FROM `golon_lj_zylj` WHERE ( `id` = 114 ) LIMIT 1
系列：74ABT
逻辑类型：扫描测试设备，带寄存总线收发器
电源电压(Vin)：4.5V ~ 5.5V
位数：8
工作温度：-40°C ~ 85°C
丝印：(请登录)
料号：1115114
量大可议价
起订量:10 修改
包装量: 1000个/ 卷带（TR） 修改
个
总额：
SELECT count(a.gys_id) as c FROM golon_gys_file_new a LEFT JOIN golon_gys_brand b on a.gys_id=b.id WHERE ( a.zzsbh = 'SN74ABT8543DLR' ) LIMIT 1
array(65) { ["id"]=> string(3) "915" ["pdf_add"]=> string(48) "http://www.ti.com/lit/ds/symlink/sn74abt8646.pdf" ["pdf_dir"]=> string(0) "" ["images_sw"]=> string(1) " " ["images_mk"]=> string(64) "//media.digikey.com/Renders/~~Pkg.Case%20or%20Series/28-SOIC.jpg" ["images"]=> string(80) "https://www.chenkeiot.com/Public/imagesmk/Renders/Pkg.Case_or_Series/28-SOIC.jpg" ["images_dir"]=> string(0) "" ["ljbh"]=> string(13) "296-4112-5-ND" ["zzsbh"]=> string(13) "SN74ABT8646DL" ["zddgs"]=> string(1) "1" ["xysl"]=> string(3) "113" ["cfkc"]=> string(1) "0" ["dj"]=> string(8) "0.000000" ["gys_id"]=> string(1) " " ["num"]=> string(1) " " ["price_addtime"]=> string(1) "0" ["ms"]=> string(29) "IC SCAN-TEST-DEV/XCVR 28-SSOP" ["xl"]=> string(5) "74ABT" ["zzs"]=> string(15) "TI/德州仪器" ["zzs_new"]=> string(15) "TI/德州仪器" ["zzs_old"]=> string(17) "Texas Instruments" ["lm"]=> string(1) "-" ["tdxl"]=> string(9) "未设定" ["ljlx"]=> string(51) "扫描测试设备，带总线收发器和寄存器" ["dydy"]=> string(11) "4.5V ~ 5.5V" ["ws"]=> string(1) "8" ["gzwd"]=> string(14) "-40°C ~ 85°C" ["azlx"]=> string(15) "表面贴装型" ["fz_wk"]=> string(20) "28-BSSOP(7.50mm 宽)" ["gysqjfz"]=> string(8) "28-BSSOP" ["djs"]=> string(1) "-" ["tag"]=> string(1) " " ["bz"]=> string(6) "管件" ["spq"]=> string(2) "40" ["moq"]=> string(2) "10" ["is_rohs"]=> string(1) "1" ["gl_zz"]=> string(6) "贴片" ["gl_pin"]=> string(2) "28" ["gl_dm"]=> string(1) "-" ["gl_dmtp"]=> string(0) "" ["symbol"]=> string(0) "" ["gl_vdd"]=> string(1) "-" ["gl_gnd"]=> string(1) "-" ["gl_jz"]=> string(1) " " ["gl_bdm"]=> string(1) "4" ["gl_bdmsm"]=> string(0) "" ["gl_kbc"]=> string(1) "0" ["gl_dmgx"]=> string(1) "0" ["pcbfzk_id"]=> string(0) "" ["pcbfzk"]=> string(1) "-" ["ljzt"]=> string(6) "在售" ["jyid"]=> string(1) "-" ["cat_id"]=> string(2) "63" ["wl_num"]=> string(4) "1115" ["admin_id"]=> string(1) "0" ["mpn_bm"]=> string(13) "golon_lj_zylj" ["ch_bm"]=> string(18) "专用逻辑器件" ["lock_dm"]=> string(1) "1" ["is_use_cat_id"]=> string(1) "0" ["is_new_time"]=> string(1) "0" ["ms_c"]=> string(1) " " ["ytfw"]=> string(1) "-" ["hot_or_top"]=> string(1) "0" ["yqjtd_pintopin"]=> string(1) " " ["yqjtd_jianrong"]=> string(1) " " }
select a.wl_num,a.parent_id,GROUP_CONCAT(b.cat_name,' ',a.cat_name) as lb,a.action_name,a.rate,a.rate_hot,ROUND(sum(a.rate+a.rate_hot/100),4) as moq_rate from golon_ics_category a left join golon_ics_category b on a.parent_id=b.id where a.mpn_bm='golon_lj_zylj' array(1) { [0]=> array(7) { ["wl_num"]=> string(4) "1115" ["parent_id"]=> string(2) "62" ["lb"]=> string(26) "逻辑 专用逻辑器件" ["action_name"]=> string(2) "l1" ["rate"]=> string(5) "1.051" ["rate_hot"]=> string(2) "35" ["moq_rate"]=> string(6) "1.4010" } }
型号： SN74ABT8646DL复制
状态： 在售 修改
品牌： TI/德州仪器复制
封装：28-BSSOP
外壳：28-BSSOP(7.50mm 宽)
描述： IC SCAN-TEST-DEV/XCVR 28-SSOP
SELECT * FROM `golon_lj_zylj` WHERE ( `id` = 915 ) LIMIT 1
系列：74ABT
逻辑类型：扫描测试设备，带总线收发器和寄存器
电源电压(Vin)：4.5V ~ 5.5V
位数：8
工作温度：-40°C ~ 85°C
丝印：(请登录)
料号：1115915
量大可议价
起订量:10 修改
包装量: 40个/ 管件 修改
个
总额：
SELECT count(a.gys_id) as c FROM golon_gys_file_new a LEFT JOIN golon_gys_brand b on a.gys_id=b.id WHERE ( a.zzsbh = 'SN74ABT8646DL' ) LIMIT 1
array(65) { ["id"]=> string(4) "1321" ["pdf_add"]=> string(48) "http://www.ti.com/lit/ds/symlink/sn74abt8646.pdf" ["pdf_dir"]=> string(0) "" ["images_sw"]=> string(1) " " ["images_mk"]=> string(64) "//media.digikey.com/Renders/~~Pkg.Case%20or%20Series/28-SOIC.jpg" ["images"]=> string(80) "https://www.chenkeiot.com/Public/imagesmk/Renders/Pkg.Case_or_Series/28-SOIC.jpg" ["images_dir"]=> string(0) "" ["ljbh"]=> string(17) "SN74ABT8646DLR-ND" ["zzsbh"]=> string(14) "SN74ABT8646DLR" ["zddgs"]=> string(4) "1000" ["xysl"]=> string(1) "0" ["cfkc"]=> string(5) "10000" ["dj"]=> string(8) "0.000000" ["gys_id"]=> string(1) " " ["num"]=> string(1) " " ["price_addtime"]=> string(1) "0" ["ms"]=> string(27) "IC SCAN TEST DEVICE 28-SSOP" ["xl"]=> string(5) "74ABT" ["zzs"]=> string(15) "TI/德州仪器" ["zzs_new"]=> string(15) "TI/德州仪器" ["zzs_old"]=> string(17) "Texas Instruments" ["lm"]=> string(1) "-" ["tdxl"]=> string(9) "未设定" ["ljlx"]=> string(51) "扫描测试设备，带总线收发器和寄存器" ["dydy"]=> string(11) "4.5V ~ 5.5V" ["ws"]=> string(1) "8" ["gzwd"]=> string(14) "-40°C ~ 85°C" ["azlx"]=> string(15) "表面贴装型" ["fz_wk"]=> string(20) "28-BSSOP(7.50mm 宽)" ["gysqjfz"]=> string(8) "28-BSSOP" ["djs"]=> string(1) "-" ["tag"]=> string(1) " " ["bz"]=> string(14) "卷带（TR）" ["spq"]=> string(4) "1000" ["moq"]=> string(2) "10" ["is_rohs"]=> string(1) "1" ["gl_zz"]=> string(6) "贴片" ["gl_pin"]=> string(2) "28" ["gl_dm"]=> string(1) "-" ["gl_dmtp"]=> string(0) "" ["symbol"]=> string(0) "" ["gl_vdd"]=> string(1) "-" ["gl_gnd"]=> string(1) "-" ["gl_jz"]=> string(1) " " ["gl_bdm"]=> string(1) "4" ["gl_bdmsm"]=> string(0) "" ["gl_kbc"]=> string(1) "0" ["gl_dmgx"]=> string(1) "0" ["pcbfzk_id"]=> string(0) "" ["pcbfzk"]=> string(1) "-" ["ljzt"]=> string(6) "在售" ["jyid"]=> string(1) "-" ["cat_id"]=> string(2) "63" ["wl_num"]=> string(4) "1115" ["admin_id"]=> string(1) "0" ["mpn_bm"]=> string(13) "golon_lj_zylj" ["ch_bm"]=> string(18) "专用逻辑器件" ["lock_dm"]=> string(1) "1" ["is_use_cat_id"]=> string(1) "0" ["is_new_time"]=> string(1) "0" ["ms_c"]=> string(1) " " ["ytfw"]=> string(1) "-" ["hot_or_top"]=> string(1) "0" ["yqjtd_pintopin"]=> string(1) " " ["yqjtd_jianrong"]=> string(1) " " }
select a.wl_num,a.parent_id,GROUP_CONCAT(b.cat_name,' ',a.cat_name) as lb,a.action_name,a.rate,a.rate_hot,ROUND(sum(a.rate+a.rate_hot/100),4) as moq_rate from golon_ics_category a left join golon_ics_category b on a.parent_id=b.id where a.mpn_bm='golon_lj_zylj' array(1) { [0]=> array(7) { ["wl_num"]=> string(4) "1115" ["parent_id"]=> string(2) "62" ["lb"]=> string(26) "逻辑 专用逻辑器件" ["action_name"]=> string(2) "l1" ["rate"]=> string(5) "1.051" ["rate_hot"]=> string(2) "35" ["moq_rate"]=> string(6) "1.4010" } }
型号： SN74ABT8646DLR复制
状态： 在售 修改
品牌： TI/德州仪器复制
封装：28-BSSOP
外壳：28-BSSOP(7.50mm 宽)
描述： IC SCAN TEST DEVICE 28-SSOP
SELECT * FROM `golon_lj_zylj` WHERE ( `id` = 1321 ) LIMIT 1
系列：74ABT
逻辑类型：扫描测试设备，带总线收发器和寄存器
电源电压(Vin)：4.5V ~ 5.5V
位数：8
工作温度：-40°C ~ 85°C
丝印：(请登录)
料号：11151321
量大可议价
起订量:10 修改
包装量: 1000个/ 卷带（TR） 修改
个
总额：
SELECT count(a.gys_id) as c FROM golon_gys_file_new a LEFT JOIN golon_gys_brand b on a.gys_id=b.id WHERE ( a.zzsbh = 'SN74ABT8646DLR' ) LIMIT 1

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